Standard By:Japanese Industrial Standard / Japanese Standards Association , 01/01/2010
Published:01/01/2010
Language:English
JIS C 2162:2010
Original price was: $54.00.$27.00Current price is: $27.00.
Test method of long-term reliability of gate insulator for SiC devices at high temperature
Japanese Industrial Standard / Japanese Standards Association , 01/01/2010
