IEC 62899-402-1:2017(E) specifies the measurement methods of the widths of the printed patterns in printed electronics. These printed pattern widths are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for thickness in printed electronics.
IEC 62899-402-1 Ed. 1.0 en:2017
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Printed electronics – Part 402-1: Printability – Measurement of qualities – Pattern width
International Electrotechnical Commission , 03/03/2017
Pages: 12
