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IEC 62047-3 Ed. 1.0 b:2006

Original price was: $25.00.Current price is: $12.00.

Semiconductor devices – Micro-electromechanical devices – Part 3: Thin film standard test piece for tensile testing

International Electrotechnical Commission , 08/15/2006

Pages: 15

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Specifies a standard test piece, which is used to guarantee the propriety and accuracy of a tensile testing system for thin film materials with length and width under 1 mm and thickness under 10 m, which are main structural materials for microelectromechanical systems (MEMS), micromachines and similar devices. It is based on such a concept that a tensile testing system can be guaranteed in propriety and accuracy, when the measured tensile strengths of the standard test pieces, whose tensile strength is pre-determined, are within the designated range. It also specifies the test pieces to minimize characteristics deviation among the pieces.
IEC 62047-3 Ed. 1.0 b:2006 pdf
IEC 62047-3 Ed. 1.0 b:2006

Original price was: $25.00.Current price is: $12.00.