Specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements. IEC 61967-1 specifies general conditions and definitions of the test methods.
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IEC 61967-4 Ed. 1.1 b:2006
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Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 4: Measurement of conducted emissions – 1 ¿¿/150 ¿¿ direct coupling method CONSOLIDATED EDITION
International Electrotechnical Commission , 07/27/2006
Pages: 65
