Gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests.
IEC 61164 Ed. 2.0 en:2004
Original price was: $243.00.$121.00Current price is: $121.00.
Reliability growth – Statistical test and estimation methods
International Electrotechnical Commission , 03/24/2004
Pages: 55
