Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.
IEC 60749-7 Ed. 1.0 b:2002
Original price was: $42.00.$21.00Current price is: $21.00.
Semiconductor devices – Mechanical and climatic test methods – Part 7: Internal moisture content measurement and the analysis of other residual gases
International Electrotechnical Commission , 04/09/2002
Pages: 15
