This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments.
This test method is considered destructive.
IEC 60749-5 Ed. 3.0 b:2023
Original price was: $51.00.$25.00Current price is: $25.00.
Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
International Electrotechnical Commission , 12/01/2023
Pages: 22
