Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
IEC 60749-4 Ed. 1.0 b:2002
Original price was: $23.00.$11.00Current price is: $11.00.
Semiconductor devices – Mechanical and climatic test methods – Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
International Electrotechnical Commission , 04/12/2002
Pages: 15
