Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device.
IEC 60749-32 Ed. 1.0 b:2002
Original price was: $25.00.$12.00Current price is: $12.00.
Semiconductor devices – Mechanical and climatic test methods – Part 32: Flammability of plastic-encapsulated devices (externally induced)
International Electrotechnical Commission , 08/30/2002
Pages: 9
