Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.
IEC 60749-31 Ed. 1.0 b:2002
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Semiconductor devices – Mechanical and climatic test methods – Part 31: Flammability of plastic-encapsulated devices (internally induced)
International Electrotechnical Commission , 08/30/2002
Pages: 9
