IEC 60749-29:2011 covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is toestablish a method for determining integrated circuit (IC) latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing “no trouble found” (NTF) and “electrical overstress” (EOS) failures due to latch-up. This second edition cancels and replaces the first edition published in 2003 and constitutes a technical revision. The significant changes with respect to the previous edition include:
– a number of minor technical changes;
– the addition of two new annexes covering the testing of special pins and temperature calculations.
– a number of minor technical changes;
– the addition of two new annexes covering the testing of special pins and temperature calculations.
