Specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics.
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IEC 60748-4-3 Ed. 1.0 en:2006
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Semiconductor devices – Integrated circuits – Part 4-3: Interface integrated circuits – Dynamic criteria for analogue-digital converters (ADC)
International Electrotechnical Commission , 08/29/2006
Pages: 36
