BS PD IEC/TR 63133:2017 specifies a design technique of performance estimation storageelement, which can monitor semiconductor ageing and characterize ageing level. Theestimated ageing level can be used to improve the reliability of system.Cross References:IEEE 1149.1:2013
BS PD IEC/TR 63133:2017
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Semiconductor devices. Scan based ageing level estimation for semiconductor devices
BSI Group , 01/29/2018
Pages: 20
