This part of IEC TS 62607, which is a Technical Specification, specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.
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BS PD IEC TS 62607-5-3:2020
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Nanomanufacturing. Key control characteristics-Thin-film organic/nano electronic devices. Measurements of charge carrier concentration
BSI Group , 04/22/2020
Pages: 24
