This part of IEC TS 62607, which is a Technical Specification, specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.
BS PD IEC TS 62607-5-3:2020
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Nanomanufacturing. Key control characteristics-Thin-film organic/nano electronic devices. Measurements of charge carrier concentration
BSI Group , 04/22/2020
Pages: 24
