Specifies requirements for the data needed to describe the test and quality parameters of semiconductor die and gives recommendations for general industry good practice. To be read in conjunction with PD ES 59008-1:2000,PD ES 59008-3:1999Cross References:ES 59008-1:1999ES 59008-2:1999ES 59008-3:1999ES 59008-6-1:1999ES 59008-6-2IEC 61360:1995
BS PD ES 59008-4-1:2001
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Data requirements for semiconductor die. Specific requirements and recommendations-Test and quality
BSI Group , 03/15/2001
Pages: 14
