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BS CECC 00013:1985

Original price was: $264.16.Current price is: $132.00.

Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice

BSI Group , 08/30/1985

Pages: 24

Category:
Describes equipment and procedures to be used for SEM inspection of discrete semiconductor devices and integrated circuits.
BS CECC 00013:1985 pdf
BS CECC 00013:1985

Original price was: $264.16.Current price is: $132.00.