Describes the test procedure intended to characterise the level of unwanted signals caused by the presence of two or more transmitting signals in waveguides or waveguide assemblies.
IEC 61580-2 Ed. 1.0 b:1996
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Methods of measurement for waveguides – Part 2: Level of intermodulation products
International Electrotechnical Commission , 06/11/1996
Pages: 17
